Relatório de estágio supervisionado.

Abstract

The analysis of parameters’s scope of microelectronics is of fundamental importance for a correct modeling and study of the component and is not a trivial task. Usually, an index analysis is done by the manufacturer, which is part of a series of pages, making it a timeconsuming and expensive task. Due to, in this document are described the activities developed by the student Telmo Gabriel de Jesus Torres de Melo in the Laboratory of Metrology and Scientific Instrumentation with a workload of 180h. The file that existed was a compilation of a list that facilitated the identification of the different types of parameters that influence the CMOS when it is inserted in the topology BiCMOS 0.13μm. This catalog focuses on key parameters that are amenable to computer simulation, making it faster and more efficient. The lack for this catalog is solve the problem that the laboratory collaborators had, due to the team don’t have the complete knowledgment of the parameters necessary to run a simulation, resulting in a waste time.